JKPS(24/12/06) Meeting

Asia/Seoul
과학관 302호

과학관 302호

Description

Attendance: 석지민, 박영민, 송우진, 김근우, 류연찬, 정민서, 윤주환,  김준하

Title: Electron beam transverse phase space tomography using nanofabricated wire scanners with submicrometer resolution

Contents

 1. Paper review: 김근우

 2. Discussion on paper

 3. Next speaker: 12/13 류연찬(FOFB), 12/20 박영민