Attendance: 석지민, 박영민, 송우진, 김근우, 류연찬, 정민서, 윤주환, 김준하
Title: Electron beam transverse phase space tomography using nanofabricated wire scanners with submicrometer resolution
Contents
1. Paper review: 김근우
2. Discussion on paper
3. Next speaker: 12/13 류연찬(FOFB), 12/20 박영민